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electron defect

См. также в других словарях:

  • Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… …   Wikipedia

  • Electron mobility — This article is about the mobility for electrons and holes in metals and semiconductors. For the general concept, see Electrical mobility. In solid state physics, the electron mobility characterizes how quickly an electron can move through a… …   Wikipedia

  • Electron microscope — Diagram of a transmission electron microscope A 197 …   Wikipedia

  • defect electron — elektroninė skylė statusas T sritis fizika atitikmenys: angl. defect electron; electron hole; electron vacancy vok. Defektelektron, n; Elektronenleerstelle, f; Elektronenloch, n rus. электронная дырка, f pranc. lacune électronique, f; trou… …   Fizikos terminų žodynas

  • Electron backscatter diffraction — An electron backscatter diffraction pattern An electron backscatter diffraction pattern of monocrystalline silicon, taken …   Wikipedia

  • defect electron conduction — skylinis laidumas statusas T sritis fizika atitikmenys: angl. defect electron conduction; hole conduction; p type conduction vok. Defektelektronenleitung, f; p Leitfähigkeit, f rus. дырочная проводимость, f; проводимость p типа, f pranc.… …   Fizikos terminų žodynas

  • electron hole — elektroninė skylė statusas T sritis fizika atitikmenys: angl. defect electron; electron hole; electron vacancy vok. Defektelektron, n; Elektronenleerstelle, f; Elektronenloch, n rus. электронная дырка, f pranc. lacune électronique, f; trou… …   Fizikos terminų žodynas

  • electron vacancy — elektroninė skylė statusas T sritis fizika atitikmenys: angl. defect electron; electron hole; electron vacancy vok. Defektelektron, n; Elektronenleerstelle, f; Elektronenloch, n rus. электронная дырка, f pranc. lacune électronique, f; trou… …   Fizikos terminų žodynas

  • Crystallographic defect — Crystalline solids exhibit a periodic crystal structure. The positions of atoms or molecules occur on repeating fixed distances, determined by the unit cell parameters. However, the arrangement of atom or molecules in most crystalline materials… …   Wikipedia

  • Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… …   Wikipedia

  • Carrier scattering — Defect types include atom vacancies, adatoms, steps, and kinks which occur most frequently at surfaces due to finite material size causing crystal discontinuity. What all types of defects have in common, whether they be surface or bulk, is that… …   Wikipedia

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